VLSI Design and Test by Brajesh Kumar Kaushik, Sudeb Dasgupta & Virendra Singh

VLSI Design and Test

By

  • Genre Computers
  • Released
  • Size 18.05 MB

Description

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

More Brajesh Kumar Kaushik, Sudeb Dasgupta & Virendra Singh Books