Pattern Analysis and Machine Intelligence by Jie Yang, Ran He & Shiwei Ma

Pattern Analysis and Machine Intelligence

By

Description

This book constitutes the referred proceedings of the Second International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2025, held in Dalian, China, during August 29–31, 2025.

The 23 papers presented here were carefully reviewed and selected from 51 submissions. Their insightful talks covered the applications, challenges, and future directions of Multimodal Foundation and Large Language Models, the frontiers and perspectives in 3D Spatial Video Reconstruction, and research on defenses and out-of-distribution detection in trustworthy deep learning.

More Jie Yang, Ran He & Shiwei Ma Books