Structural, Syntactic, and Statistical Pattern Recognition by Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio & Antonio Robles-Kelly

Structural, Syntactic, and Statistical Pattern Recognition

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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.
The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods. 

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